GONZALEZ, J. M.; RESTREPO, J. S.; ORTEGA PORTILLA, C.; RUDEN MUÑOZ, A.; SEQUEDA OSORIO, F. Influence of Si Atoms Insertion on the Formation of the Ti-Si-N Composite by DFT Simulation. Ingeniería y Ciencia, [S. l.], v. 12, n. 23, p. 11–23, 2016. DOI: 10.17230/ingciencia.12.23.1. Disponível em: https://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/3211. Acesso em: 28 mar. 2024.