Fabrication and Characterization of Alq3 Thin Films

Authors

DOI:

https://doi.org/10.17230/ingciencia.10.20.3

Keywords:

thin film, thermal evaporation, substrate, characterization, organic semiconductor

Abstract

Alq3 (tris (8-hydroxyquinolate) aluminum) thin films were deposited on glass by thermal evaporation in order to establish the optimal evaporation
rates of thin films deposited between 30 to 120nm on a substrate with temperatures between 60 and 120°C. The thin films were characterized by SEM microscopy and perfilometry to compare the obtained thickness in-situ by quartz crystals; furthermore photoluminescence measures were made.

PACS: 73.55.k2, 7855.-m, 06.60Sx, 07.30.Kf.

Video: https://www.youtube.com/watch?v=cEIQnNGtzlc

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Author Biographies

  • R. P. Adames, Universidad Nacional de Colombia Sede Bogoá

    Física

  • J A Segura, Universidad Nacional de Colombia
    MSc. Física
  • D P Gómez, Universidad Nacional de Colombia
    Física
  • A M Ardila, Universidad Nacional de Colombia
    Dr. Física

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Vol. 10 No. 20 (2014)

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How to Cite

Adames, R. P., Segura, J. A., Gómez, D. P., & Ardila, A. M. (2014). Fabrication and Characterization of Alq3 Thin Films. Ingeniería Y Ciencia, 10(20), 37-50. https://doi.org/10.17230/ingciencia.10.20.3