Scanning Probe Microscopy: a basic tool in nanosciences

Abstract

The latest generation in microscopic technology has introduced a group of techniques generically referred to as Scanning Probe Microscopy (SPM). Through these tools it is possible to perform detailed analysis of morphological, mechanical and chemical properties, among others, of the studied surface, with resolutions sometimes better than the ones obtained through scanning electron microscopy. New technologies, based on nanosciences, use these instruments to get augmented images of a few groups of atoms organized by nature itself or as a consequence of the manipulation made possible by nanotechnology. In this paper, a basic description of functioning principles and a general overview of applications of the SPM techniques in material analysis are presented. Some results obtained with different samples are also described.