Fraccional Fourier transform in the case of an inclined image plane

Authors

  • C O Torres Grupo LOI, Universidad Popular del Cesar
  • L Mattos Grupo LOI, Universidad Popular del Cesar
  • C Jiménez docente, grupo GIMA, Universidad de La Guajira
  • Jaime Castillo Pérez docente, grupo GIMA, Universidad de La Guajira
  • Y Torres Docente investigador, grupo GOTS, Universidad Industrial de Santander

Keywords:

Fresnel diffraction, inclined image plane, fractional Fourier transform.

Abstract

The well-known Fresnel integral relates a known complex wave defined in the object plane (the input wave field) to the observable complex wave (the output wave field) defined in the image plane after free-space propagation; this means that if the object and image plane are parallel to each other, corresponding imaging system is said to be linear-shift-invariant (LSI). This advantageous property was essential for the development of phase sensitive imaging techniques; however, if the image plane is inclined with respect to the incident beam, the effective propagation distance will vary over the image plane, consequently, the imaging system is not shiftinvariant. In this paper an extension of the theoretical formalism of Fresnel diffraction to the case of an inclined image plane is proposed using the fractional Fourier transform.

MSC: 33D15, 33D90, 33D60, 34M03,  62E15

Downloads

Download data is not yet available.

Author Biographies

  • C O Torres, Grupo LOI, Universidad Popular del Cesar
    Doctor en Ciencias físicas.
  • L Mattos, Grupo LOI, Universidad Popular del Cesar
    Magíster en Ingeniería electrónica.
  • C Jiménez, docente, grupo GIMA, Universidad de La Guajira
    Magíster en Matemática aplicada.
  • Jaime Castillo Pérez, docente, grupo GIMA, Universidad de La Guajira
    Magíster en Matemática aplicada.
  • Y Torres, Docente investigador, grupo GOTS, Universidad Industrial de Santander

    Docteur en Optique et Traitement du Signal.

References

Robert A. Sprague. Surface Roughness Measurement Using White Light Speckle. Applied Optics, ISSN 0003–6935, 11(12), 2811–2816 (1972).

P. J. Chandley. Surface roughness measurements from coherent light scattering. Optical and Quantum Electronics, ISSN 0306–8919, 8(4), 323–327 (1976).

H. M. Pedersen. Object–roughness dependence of partially developed speckle patterns in coherent light . Optics Communications, ISSN 0030–4018, 16(1), 63–67 (1976).

H. Fuji, T. Asakura and Y. Shindo. Measurement of surface roughness properties by means of laser speckle techniques. Optics Communications, ISSN 0030–4018,16(1), 68–72 (1976).

Hitoshi Fujii and Toshimitsu Asakura. Roughness measurements of metal surfaces using laser speckle. Journal of the Optical Society of America B, ISSN 0740–3224, 67(9), 1171–1176 (1977).

Ulf Persson. Real time measurement of surface roughness on ground surfaces using speckle–contrast technique. Optics and Lasers in Engineering, ISSN 0143–8166, 17(2), 61–67 (1992).

Lisa C. Leonard and Vincent Toal. Roughness measurement of metallic surfaces based on the laser speckle contrast method. Optics and Lasers in Engineering, ISSN 0143–8166, 30(5), 433–440 (1998).

S. L. Toh, H. M. Shang and C. J. Tay. Surface–roughness study using laser speckle method. Optics and Lasers in Engineering, ISSN 0143–8166, 29(2–3), 217–225 (1998).

Downloads

Issue

Section

Articles

How to Cite

Torres, C. O., Mattos, L., Jiménez, C., Castillo Pérez, J., & Torres, Y. (2010). Fraccional Fourier transform in the case of an inclined image plane. Ingeniería Y Ciencia, 6(12), 51-64. https://publicaciones.eafit.edu.co/index.php/ingciencia/article/view/332

Most read articles by the same author(s)