Métodos empleados en el análisis de espectroscopía óptica de emisión: una revisión

Main Article Content

D M Devia
L. V Rodriguez-Restrepo
E Restrepo-Parra

Keywords

OES, plasma parameters, elemental determination, line intensity, broadening, shifting

Resumen

En este trabajo se presentan diferentes métodos empleados para el análisis de espectros ópticos de emisión. El propósito es calcular la temperatura de excitación (Texc), temperatura electrónica (Te) y densidad electrónica (ne) empleando diversas técnicas usadas en el crecimiento de películas delgadas. Algunas de estas técnicas incluyen magnetron sputtering y descargas n arco. Inicialmente, se describirán algunos principios fundamentales que soportan la técnica de Espectroscopía Óptica de Emisión (EOE); posteriormente, se considerarán algunas reglas que deben considerarse para el análisis de espectros con el fin de evitar ambigüedades. Finalmente, se presentarán algunos d los métodos espectroscópicos más determinar las propiedades físicas de plasmas.

PACS: 52.25.Dg, 31.15.V

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